Abstract

Vertically aligned carbon nanofibers (VACNF) have been synthesized where the crystallographic orientation of the initial catalyst film was preserved in the nanoparticle that remained at the nanofiber tip after growth. A substantial percentage of catalyst particles (75%), amounting to approximately 200 million nanofibers over a 100 mm Si wafer substrate, exhibited a sixfold symmetry attributed to a cubic Ni(1 1 1)Si(0 0 1) orientation relationship which was verified by X-ray diffraction studies. The Ni catalyst films were prepared by rf-magnetron sputtering under substrate bias conditions to yield a single (1 1 1) film texture. The total energy of the Ni thin film was estimated by calculating the sum of the surface free energy and strain energy. The total film energy was minimized by the evolution of the plane of lowest surface free energy, the (1 1 1) texture. This result was in agreement with X-ray diffraction measurements. The preferred orientation present in the Ni catalyst film prior to nanofiber growth was preserved in the Ni catalyst particles throughout the VACNF growth process. The Ni catalyst particles at the nanofiber tips were not pure single crystals but rather consisted of a mosaic structure of Ni nanocrystallites embedded within Ni catalyst nanoparticles (200–400 nm). The tip-located nanoparticles exhibited a faceted, crystal morphology with the faceting transferred to the underlying carbon nanofiber during the growth process. The possibility of precisely and accurately controlling VACNF growth velocity over macroscopic wafer dimensions with uniformly aligned catalyst particles is discussed.

Keywords: Carbon fibers; Catalyst; Plasma sputtering; X-ray diffraction; Phase transitions

Corresponding author. Address: Materials Science and Engineering Department, The University of Tennessee, Knoxville, TN 37996-2200, United States. Fax: +1 865 974 4115.