Four-probe charge transport measurements on individual vertically aligned carbon nanofibers

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The following article appeared in Applied Physics Letters -- May 17, 2004 -- Volume 84, Issue 20, pp. 3972-3974

  and may be found at (URL/link for published article abstract).

(full text pdf)

Copyright (2005) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.


Lan Zhang, Derek Austin, Vladimir I. Merkulov, Anatoli V. Meleshko,
and Kate L. Klein
Molecular-Scale Engineering and Nanoscale Technologies Research Group, Oak Ridge National Laboratory, P.O. Box 2008, MS 6006, Oak Ridge, Tennessee 37831
Michael A. Guillorn
Cornell Nanofabrication Facility, 250 Duffield Hall, Ithaca, New York 14853
Douglas H. Lowndes
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831
Michael L. Simpson
Molecular-Scale Engineering and Nanoscale Technologies Research Group, Oak Ridge National Laboratory, P.O. Box 2008, MS 6006, Oak Ridge, Tennessee 37831

 

(Received 11 December 2003; accepted 26 March 2004; published online 3 May 2004)

We report four-probe IV measurements on individual vertically aligned carbon nanofibers (VACNFs). These measurements were enabled by the fabrication of multiple Ti/Au ohmic contacts on individual fibers that exhibited resistance of only a few kilohms. These measurements demonstrate that VACNFs exhibit linear IV behavior at room temperature, with a resistivity of approximately 4.2×10–3 Omega cm. Our measurements are consistent with a dominant transport mechanism of electrons traveling through intergraphitic planes in the VACNFs. ©2004 American Institute of Physics.